Spectroscopic Ellipsometry Study of Co3O4 Thin Films Deposited on Several Metal Substrates
نویسنده
چکیده
Spectroscopic ellipsometry and atomic force microscope techniques were employed to analyze optical properties, microstructure and thickness of cobalt oxide thin films deposited on metal substrates by the sol-gel dipping method. The ellipsometric data were conveniently fitted, assuming a stratified structure for the deposited film, which consists of a sublayer native oxide that was coated with a bi-layered Co3O4 film. The dispersion curves (refractive indices and extinction coefficients) were reported in the 1.5–4.5 eV photon energy range. Excluding the Fe substrate, in which nucleation failed to grow Co3O4, all deposited films have the Co3O4 cobalt oxide phase as the predominant one. Additional data concerning solar parameters such as absorptance, emittance and selectivity of Co3O4/metal structures were also reported.
منابع مشابه
Study of Iridium (Ir) Thin Films Deposited on to SiO2 Substrates
Very smooth thin films of iridium have been deposited on super polished fused silica (SiO2) substrates using dc magnetron sputtering in argon plasma. The influence of deposition process parameters on film micro roughness has been investigated. In addition, film optical constants have been determined using variable angle spectroscopic ellipsometery, over the spectra range from vacuum ultraviolet...
متن کاملA Study of ZnO Buffer Layer Effect on Physical Properties of ITO Thin Films Deposited on Different Substrates
The improvement of the physical properties of Indium Tin Oxide (ITO) layers is quite advantageous in photovoltaic applications. In this study the ITO film is deposited by RF sputtering onto p-type crystalline silicon (c-Si) with (100) orientation, multicrystalline silicon (mc-Si), and glass substrates coated with ZnO and annealed in vacuum furnace at 400°C. Electrical, optical, structural a...
متن کاملOptical and physical properties of cobalt oxide films electrogenerated in bicarbonate aqueous media.
For the first time, cobalt oxide films that are highly protective against localized corrosion and depicting a wide variety of bright and uniform colors due to light interference, have been successfully electrogenerated on polycrystalline cobalt disk electrodes under potentiostatic polarization in a mild aqueous bicarbonate medium. Open circuit potential measurements have shown the formation of ...
متن کاملPhase and microstructure investigations of boron nitride thin films by spectroscopic ellipsometry in the visible and infrared spectral range
Phase and microstructure investigations of boron nitride thin films by spectroscopic ellipsometry in the visible and infrared spectral range" (1997). Faculty Publications from the Department of Electrical and Computer Engineering. 64. Spectroscopic ellipsometry over the spectral range from 700 to 3000 cm Ϫ1 and from 1.5 to 3.5 eV is used to simultaneously determine phase and microstructure of p...
متن کاملIn situ ellipsometry growth characterization of dual ion beam deposited boron nitride thin films
In situ ellipsometry growth characterization of dual ion beam deposited boron nitride thin films" (2000). Faculty Publications from the Department of Electrical and Computer Engineering. 19. Pure hexagonal h, as well as mixed-phase cubic/hexagonal c/h boron nitride ͑BN͒ thin films were deposited onto ͓001͔ silicon substrates using the dual ion beam deposition technique. The BN thin films were grown...
متن کامل